Section XVIII — Optical, photographic, cinematographic, measuring, checking, precision, medical or surgical instruments and apparatus; clocks and watches; musical instruments; parts and accessories thereof
Chapter 90 — Optical, photographic, cinematographic, measuring, checking, precision, medical or surgical instruments and apparatus; parts and accessories thereof
Heading 9030 — Oscilloscopes, spectrum analysers and other instruments and apparatus for measuring or checking electrical quantities, excluding meters of heading 90.28; instruments and apparatus for measuring or detecting alpha, beta, gamma, Xray, cosmic or other ionising radiations.
National subdivision 9030.8 — Other instruments and apparatus:
Subheading
9030.82 For measuring or checking semiconductor wafers or devices (including integrated circuits)
Common commodities
Semiconductor wafer continuity checkerIC device parametric testerWafer probe station equipmentElectrical wafer performance analyzerIntegrated circuit testers for wafersAutomated semiconductor wafer inspectorSemiconductor chip electrical parameter checkerWafer parametric test and measurement systemWafer probe system for integrated circuitsChip electrical performance testing equipment
HS codes
| Code | Description | Taxes | |
|---|---|---|---|
| 9030.82.00 | For measuring or checking semiconductor wafers or devices | Customs TaxCID, PAL, SSCL, VAT |